Elliptika’s ELL-RA-DP-02001800-01 reflectometry bench is a compact, lightweight and inexpensive bench for characterizing objects such as absorbent materials needed by radars.
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Elliptika’s ELL-RA-DP-02001800-01 reflectometry bench is a compact, lightweight and inexpensive bench for using objects such as absorbent materials needed for radar. The measurement does not need to take place in an anechoic chamber thanks to the base in absorbent material and the structure in electromagnetically transparent polyurethane.
Elliptika’s reflectometry bench consists of two 2-18 GHz dual-polarized antennas placed at an angle of 20 °. Dual-polarized antennas allow the user to measure both TE and TM polarization without complex configuration changes. In addition, dual polarization allows measurement of cross polarization and a circularly polarized incident wave using a coupler (not included).
- Frequency range: 2 to 18 GHz
- 20 ° angle
- Polarization: TE, TM (included), LHCP or RHCP (optional)
- Cross polarization
- No anechoic chamber required
- Compact and lightweight